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ACW invests heavily in facilities to fully test customers'
products to ensure consistent high quality.
Computer Aided Design/Computer Aided Manufacture (CAD/CAM)
ACW's engineers use
"Fabmaster" for rapid test and manufacturing documentation development
giving minimal design to delivery cycle times. Customers also benefit
from testability analysis and rectification opportunity prior to capital
expenditure. Computer assisted board diagnostics give us rapid, accurate
identification of test faults; this increases our ability to deliver
on time at lowest cost.
In
Circuit Automatic Test Equipment (ATE) - Bed of Nails
Our fully trained programming and operating staff deploy Teradyne
1890VP machines with a capacity of 2048 analogue/digital nodes.
These machines allow fast programming and high speed operation as well
as low overhead Engineering Change Orders (ECOs). Capable of dealing
with CAD converted data, the machines provide state of the art vector
and vectorless testing. Teradyne's MultiScan tool set enables testing
of connectors and other components. The machines can test complex custom
integrated circuits, with or without test vectors being available.
In Circuit ATE - Flying Probe
Flying probe ATE is Takaya APT9411/01/00CE from Itochu. Our high
speed probers enable rapid programming and fast in circuit test of low
volume products, including prototypes, without the high cost of dedicated
fixtures. These machines are fitted with Automatic Optical Inspection
(AOI) on the prober heads.
Functional
Test - Digital
ACW uses fast digital functional ATE from Marconi (now IFR),
supplemented with CIMTEK (was Wayne Kerr) and others. ACW has
fully automatic BABT characteristics test capability.
Boundary
Scan - JTAG
ACW makes extensive use of the JTAG software and hardware platform
to provide fast cost-effective test of suitably designed circuits
Automatic
Optical Inspection - AOI
ACW has DiagnoSYS ScanPoint 50s in the most critical lines to
augment human inspection for presence and alignment prior to reflow
and off line processes. DiagnoSYS VisionPoint, DCB SuperVision
III and YesTech AOI complement in circuit test and are used
for printed circuit boards and component placements that cannot be physically
tested. In addition the Takaya Flying Probers give excellent
complementary coverage on low volume boards.
X-Ray
Inspection
ACW uses the X-Tek CPXS Real
Time, microfocus X-ray 3 Dimensional imaging machine for detection,
verification and failure analysis of solder joints, in particular for
use on Ball Grid Arrays (BGAs) & Chip Scale Packages (CSPs). This advanced
X-ray inspection technique provides more effective quality control,
improved failure analysis and enhanced process control to give increased
quality and first time test yields as well as a reduction in the cost
of rework. Copies of X-ray photographs can be supplied to customers
to fulfill their requirements for quality recording.
Environmental
Stress Screening - ESS
Products may be stressed in a variety of ways including computer controlled
cycling in a highly accelerated stress screening (HASS) chamber with
temperature changes of up to 50°C per minute.
Bespoke
ACW has a first class technical team who generate complex hardware and
software test solutions. Mostly PC-based & programmed using "C",
LabView, ProComm or PERL Script, our test rigs are able to conduct tests
which often exceed the expectations of our customers. We have access
to comprehensive in-house CNC facilities for production of custom test
fixtures. We have produced sophisticated stand alone automated functional
and soak test systems which provide very high levels of confidence in
field reliability.
| ATE
summary |
X
- Ray Summary |
| · |
6
x
Teradyne
1890VP with MultiScan |
· |
X-Tek
Hawk 160 |
| · |
5
x Takaya APT9400/01/11CE |
|
|
| · |
CIMTEK
Exordia 5950
(compatible with Wayne Kerr 3900 Series) |
Boundary
Scan |
| · |
Marconi
520 with DTS |
· |
JTAG
Development & Run Time Software & Hardware |
| · |
3
x Mindready (Yelo) BABT testers |
|
|
| |
|
Environmental
Stress Screening |
| |
AOI
summary |
· |
-70ºC
to 150ºC ramp rate 50ºC / minute |
| · |
4
x DiagnoSYS ScanPoint 50 (in line) |
|
|
| · |
1
x DiagnoSYS VisionPoint |
Other
test equipment from |
| · |
5
x Takaya APT9400/01/11CE |
· |
Hewlett
Packard |
| · |
2 x YesTech
|
· |
Tektronix |
| · |
DCB
SuperVision III |
· |
Electron
Processing |
| |
|
· |
Racal |
| |
|
· |
Neutrik |
| |
|
· |
Trend |
| |
|
· |
and
others |
|